TTC JDS Acterna CENTEST 650-S Wideband Remote Test Unit -

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TTC JDS Acterna CENTEST 650-S Wideband Remote Test Unit

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Category: Network Testers, Analyzers, & Test Sets
Manufacturer: Acterna / TTC
Part Number: Centest 650-S
Quantity: 1
Price Each: $5,295.00


Description: The TTC Centest 650-S is a centralized test system that remotely tests DS3, DS1, DS0, and DDS circuits accessed from a digital cross connect system (DCS) or other network element. With the ability to test services and facilities throughout the entire network from the network control center, the Centest 650-S offers the ability to lower maintenance costs, improve responsiveness to customers, and enable more efficient network troubleshooting.

The DTU module provides maximum testing flexibility by using a programmable DSP-based design. Configurable for DS1 facility access digroup (FAD) and fractional T1 (FT1) testing from a 3/1 or 1/0 DCS, the DTU module also provides DS0 test access digroup (TAD) testing from a 1/0 DCS, including voice frequency (VF) and DDS. Using a test port on an Alcatel 1630 or DSC DEX CS 1/0 DCS, the DTU module nonconcurrently performs single, dual, or universal FAD testing on a DCS with a test port, reducing the need for two DTU modules. And with optional DS0 drop and insert software, the DTU module will perform all DS0 testing from a 3/1 DCS. As your mix of services changes over time, the DTU module adapts to meet your specific needs, maximizing your investment in Centest equipment.

The DTU module and the Centest 650-S platform enables you to monitor and maintain existing services and facilities as well as verify the quality of new VF, DDS, FT1, and DS1 circuit installations. When the DTU module is coupled with the DS3 capabilities of the Centest 650-S, the combination is your complete central office test solution.

INCLUDES:
  • (1) TTC Centest 650-S
    • (1) DTU Module
    • (1) CPU Module
    • (1) Power Supply

SPECIFICATIONS:
  • Efficient use of testing personnel
  • Improve responsiveness to customers
  • Flexible and scalable
  • Reduce equipment costs
  • Increase return on DCS investment
  • Multirate backplane
  • Sun SPARC architecture
  • Slots for multiple test cards, including 6 Application Test Cards in the Centest 650-S
  • Interface with DCS and test access devices
  • Ethernet, X.25, and dial-up modem interfaces
  • Applications:
    • DS3, DS1, and DS0 turn-up and maintenance testing in an LEC or IXC network
    • Service turn-up and maintenance testing of wireless cell site facilities




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