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Description: The HP 8509B lightwave polarization analyzer system is one of the first systems to offer calibrated polarization measurements of optical signals and components. These new capabilities are provided by innovations in hardware, software, and mathematics. Hardware contributions include a four-diode detection scheme covering 1200 nm to 1600 nm. Single wavelength, 1300 and 1550 nm Fabry-Perot lasers, and an automatic three-state polarization generator are provided within the HP 8509B. External single-wavelength or swept-wavelength sources can also be used.
System software delivers an easy-to-understand data display of simultaneous, numeric and graphic formats featuring average power, degree of polarization, Poincare sphere, polarization ellipse, Jones matrix, Stokes parameters, and polarization-maintaining-fiber launch conditions. Mathematical innovation in Jones matrix analysis automate and simplify the measurements of polarization mode dispersion, polarization dependent loss, and polarization reference frames.
This unit has the following features:
Automated polarization-mode dispersion measurements
Calibrated, real-time measurements of state and degree of polarization
Fast, automatic measurements of polarization-dependent loss in optical components
This unit has the following specififcations:
Wavelength: 1200 to 1600 nm
Input Power: + 10 to -55 dBm
Avg. Linearity: ± 0.6 dB
Avg. Measurement Uncertainty: ± 15 %
Degree of Polarization Measurement Uncertainty:
1200 to 1280 nm: ± 5 %
1280 to 1340 nm: ± 2 %
1470 to 1580 nm: ± 2 %
1580 to 1600 nm: ± 3 %
Measurement Rate: >1000 per second
Average Optical Power Output:
1310 nm: 300 mW
1550 nm: 230 mW
Wavelength Accuracy: ± 20 nm
Does not include interconnect cable.
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